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In many electrical and electronic systems, metallic enclosures are used to provide electromagnetic shielding. These enclosures normally contain thin wires, thin slots, and frequency-selective slots (FSS) that degrade the shielding effects. In this paper, integrated FDTD formulations are developed that can model both subcellular thin slots and thin wires simultaneously. The formulations are shown to be capable of accurately predicting shielding effectiveness and inner field distributions of a metallic enclosure in both the frequency- and time-domains when subject to a high-power electromagnetic pulse.