Details

Autor(en) / Beteiligte

• Clénet, S.
• Ida, N.

Titel

Error estimation in a stochastic finite element method in electrokinetics

Ist Teil von

• International journal for numerical methods in engineering, 2010-03, Vol.81 (11), p.1417-1438

Ort / Verlag

Chichester, UK: John Wiley & Sons, Ltd

Erscheinungsjahr

2010

Link zum Volltext

Quelle

Wiley Blackwell Single Titles

Beschreibungen/Notizen

• Input data to a numerical model are not necessarily well known. Uncertainties may exist both in material properties and in the geometry of the device. They can be due, for instance, to ageing or imperfections in the manufacturing process. Input data can be modelled as random variables leading to a stochastic model. In electromagnetism, this leads to solution of a stochastic partial differential equation system. The solution can be approximated by a linear combination of basis functions rising from the tensorial product of the basis functions used to discretize the space (nodal shape function for example) and basis functions used to discretize the random dimension (a polynomial chaos expansion for example). Some methods (SSFEM, collocation) have been proposed in the literature to calculate such approximation. The issue is then how to compare the different approaches in an objective way. One solution is to use an appropriate a posteriori numerical error estimator. In this paper, we present an error estimator based on the constitutive relation error in electrokinetics, which allows the calculation of the distance between an average solution and the unknown exact solution. The method of calculation of the error is detailed in this paper from two solutions that satisfy the two equilibrium equations. In an example, we compare two different approximations (Legendre and Hermite polynomial chaos expansions) for the random dimension using the proposed error estimator. In addition, we show how to choose the appropriate order for the polynomial chaos expansion for the proposed error estimator. Copyright © 2009 John Wiley & Sons, Ltd.