Details

Autor(en) / Beteiligte

• Hub, C.
• Wenzel, S.
• Raabe, J.
• Ade, H.
• Fink, R. H.

Titel

Surface sensitivity in scanning transmission x-ray microspectroscopy using secondary electron detection

Ist Teil von

• Review of scientific instruments, 2010-03, Vol.81 (3), p.033704-033704-5

Ort / Verlag

United States: American Institute of Physics

Erscheinungsjahr

2010

Quelle

Alma/SFX Local Collection

Beschreibungen/Notizen

• The successful integration of electron detection into an existing scanning transmission x-ray microspectroscope (STXM) at the Swiss Light Source is demonstrated. In conventional x-ray detection using a photomultiplier, STXM offers mainly bulk sensitivity combined with high lateral resolution. However, by implementation of a channeltron electron multiplier, the surface sensitivity can be established by the detection of secondary electrons emitted from the sample upon resonant excitation. We describe the experimental setup and discuss several relevant aspects, in particular the schemes to correct for self-absorption in the specimen due to back illumination in case of thicker films.