Nano letters, 2006-04, Vol.6 (4), p.583-586
2006
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Details
- Autor(en) / Beteiligte
- Titel
- Zeptogram-Scale Nanomechanical Mass Sensing
- Ist Teil von
- Nano letters, 2006-04, Vol.6 (4), p.583-586
- Ort / Verlag
- Washington, DC: American Chemical Society
- Erscheinungsjahr
- 2006
- Quelle
- MEDLINE
- Beschreibungen/Notizen
- Very high frequency (VHF) nanoelectromechanical systems (NEMS) provide unprecedented sensitivity for inertial mass sensing. We demonstrate in situ measurements in real time with mass noise floor ∼20 zg. Our best mass resolution corresponds to ∼7 zg, equivalent to ∼30 xenon atoms or the mass of an individual 4 kDa molecule. Detailed analysis of the ultimate sensitivity of such devices based on these experimental results indicates that NEMS can ultimately provide inertial mass sensing of individual intact, electrically neutral macromolecules with single-Dalton (1 amu) resolution.
- Sprache
- Englisch
- Identifikatoren
- ISSN: 1530-6984eISSN: 1530-6992DOI: 10.1021/nl052134mTitel-ID: cdi_proquest_miscellaneous_67858241
- Format
- –
- Schlagworte
- Applied sciences, Electronics, Equipment Design, Equipment Failure Analysis, Exact sciences and technology, Flow Injection Analysis - instrumentation, Flow Injection Analysis - methods, Gases - analysis, Mechanics, Micro- and nanoelectromechanical devices (mems/nems), Microchemistry - instrumentation, Microchemistry - methods, Microfluidic Analytical Techniques - instrumentation, Microfluidic Analytical Techniques - methods, Molecular Weight, Nanotechnology - instrumentation, Nanotechnology - methods, Particle Size, Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices, Transducers