Details

Autor(en) / Beteiligte

• Heisel, M.
• Kaether, F.
• Simgen, H.

Titel

Statistical analysis of low-level material screening measurements via gamma-spectroscopy

Ist Teil von

• Applied radiation and isotopes, 2009-05, Vol.67 (5), p.741-745

Ort / Verlag

England: Elsevier Ltd

Erscheinungsjahr

2009

Quelle

MEDLINE

Beschreibungen/Notizen

• Background estimations in neutrinoless double beta decay experiments (0νββ) require reliable statistical limits on gamma-spectrometric low-level material screening measurements. For this purpose a custom method based on Bayesian statistics with reference to the international standard ISO 11929-7 is presented. The analysis combines the data from sample- and background spectra and comprises the physical knowledge of non-negative counting rates. It allows to incorporate multiple gamma lines of radionuclides. The confidence intervals pass continuously from two-sided intervals into single-sided upper limits.