Details

Autor(en) / Beteiligte

• Singh, Rajeev
• Shakouri, Ali

Titel

Thermostat for high temperature and transient characterization of thin film thermoelectric materials

Ist Teil von

• Review of scientific instruments, 2009-02, Vol.80 (2), p.025101-025101

Ort / Verlag

United States

Erscheinungsjahr

2009

Link zum Volltext

Quelle

Alma/SFX Local Collection

Beschreibungen/Notizen

• We have designed and fabricated a vacuum-insulated thermostat capable of measuring the thermoelectric properties of thin films from room temperature to 850 K. High speed Seebeck voltage transients are resolved to 200 ns with 63 dB dynamic range in order to directly measure thermoelectric device figure of merit. In-plane Seebeck coefficient probes measure voltage and temperature difference at identical locations with low parasitic contributions. In-plane electrical conductivity measurement is accomplished at high speed to avoid possible Seebeck voltage effect on van der Pauw measurements.