Details

Autor(en) / Beteiligte

• Cançado, L.G.
• Takai, K.
• Enoki, T.
• Endo, M.
• Kim, Y.A.
• Mizusaki, H.
• Speziali, N.L.
• Jorio, A.
• Pimenta, M.A.

Titel

Measuring the degree of stacking order in graphite by Raman spectroscopy

Ist Teil von

• Carbon (New York), 2008-02, Vol.46 (2), p.272-275

Ort / Verlag

Oxford: Elsevier Ltd

Erscheinungsjahr

2008

Quelle

Alma/SFX Local Collection

Beschreibungen/Notizen

• This manuscript reports the analysis of the G′ band profile in the Raman spectra of nanographites with different degrees of stacking order. Since the G′ band scattering coming from the 2D and 3D phases coexisting in the same sample can be nicely distinguished, the relative volumes of 3D and 2D graphite phases present in the samples can be estimated from their Raman spectra. The comparison between Raman scattering and X-Ray diffraction data shows that Raman spectroscopy can be used as an alternative tool for measuring the degree of stacking order of graphitic systems.