Details
- Autor(en) / Beteiligte
- Titel
- Transmission Electron Microscopy and Diffractometry of Materials
- Auflage
- Third Edition
- Ort / Verlag
- Berlin, Heidelberg: Springer Nature
- Erscheinungsjahr
- 2007
- Link zum Volltext
- Quelle
- Alma/SFX Local Collection
- Beschreibungen/Notizen
- This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM.
- Sprache
- Englisch
- Identifikatoren
- ISBN: 354073886X, 9783540738862, 9783540738855, 3540738851ISSN: 1439-2674DOI: 10.1007/978-3-540-73886-2Titel-ID: cdi_proquest_miscellaneous_31656131
- Format
- –
- Schlagworte
- Characterization and Evaluation of Materials, Chemistry and Materials Science, Crystallography and Scattering Methods, Engineering & allied operations, Engineering, general, Materials, Materials Science, Microscopy, Solid State Physics, Spectroscopy and Microscopy, Surfaces and Interfaces, Thin Films, Transmission electron microscopy, X-ray diffractometer