Details

Autor(en) / Beteiligte

• Ross, R. R.
• Fabian, A. C.

Titel

A comprehensive range of X-ray ionized-reflection models

Ist Teil von

• Monthly notices of the Royal Astronomical Society, 2005-03, Vol.358 (1), p.211-216

Ort / Verlag

Oxford, UK: Blackwell Publishing Ltd

Erscheinungsjahr

2005

Link zum Volltext

Quelle

Wiley Online Library Journals Frontfile Complete

Beschreibungen/Notizen

• X-ray ionized reflection occurs when a surface is irradiated with X-rays so intense that its ionization state is determined by the ionization parameter ξ∝F/n, where F is the incident flux and n the gas density. It occurs in accretion, on to compact objects including black holes in both active galaxies and stellar-mass binaries, and possibly in gamma-ray bursts. Computation of model reflection spectra is often time consuming. Here we present the results from a comprehensive grid of models computed with our code, which has now been extended to include what we consider to be all energetically important ionization states and transitions. This grid is being made available as an ionized-reflection model, reflion, for xspec.