Sie befinden Sich nicht im Netzwerk der Universität Paderborn. Der Zugriff auf elektronische Ressourcen ist gegebenenfalls nur via VPN oder Shibboleth (DFN-AAI) möglich. mehr Informationen...
IEEE transactions on applied superconductivity, 2005-06, Vol.15 (2), p.114-116
Ort / Verlag
New York, NY: IEEE
Erscheinungsjahr
2005
Quelle
IEEE Electronic Library (IEL)
Beschreibungen/Notizen
A new type of nonhysteretic Josephson junction suitable for applications in voltage metrology has been developed. These junctions derive from the Nb/Al-AlO/sub x//Nb SIS junctions using a relatively thick Al layer oxidized at a low value of oxygen exposure. This produces junctions with reproducible and spatially homogeneous I-V characteristics, having current densities ranging from 10/sup 3/ to more than 2/spl times/10/sup 4/ A/cm/sup 2/ and characteristic voltages up to 0.40 mV. The authors report here the rf response of these junctions at 70 GHz. The authors have measured the dependence of the rf-induced steps on the microwave power and the stability of the steps, in view of a future application of these junctions to an AC Josephson voltage standard.