IEEE journal of solid-state circuits, 2005-05, Vol.40 (5), p.1147-1156
2005
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Details
- Autor(en) / Beteiligte
- Titel
- A high-sensitivity CMOS image sensor with gain-adaptive column amplifiers
- Ist Teil von
- IEEE journal of solid-state circuits, 2005-05, Vol.40 (5), p.1147-1156
- Ort / Verlag
- New York, NY: IEEE
- Erscheinungsjahr
- 2005
- Quelle
- IEEE Xplore
- Beschreibungen/Notizen
- A high-sensitivity CMOS image sensor using gain-adaptive column amplifiers is presented and tested. The use of high gain for the column amplifier reduces input-referred random noise, and when coupled with a column-based digital noise cancellation technique, also reduces fixed pattern noise. An experimental application of the circuit using 0.25-/spl mu/m CMOS technology with pinned photodiodes gave an rms random noise of 263 /spl mu/V and an rms fixed pattern noise of 50 /spl mu/V.
- Sprache
- Englisch
- Identifikatoren
- ISSN: 0018-9200eISSN: 1558-173XDOI: 10.1109/JSSC.2005.845969Titel-ID: cdi_proquest_miscellaneous_28002882
- Format
- –
- Schlagworte
- Amplifiers, Applied sciences, Circuit noise, Circuit properties, Circuits, CMOS, CMOS image sensors, CMOS technology, column amplifier, Design. Technologies. Operation analysis. Testing, Electric, optical and optoelectronic circuits, Electronic circuits, Electronics, Exact sciences and technology, gain-adaptive amplifier, High gain, Image sensors, Imaging devices, Integrated circuits, low readout noise, Low-noise amplifiers, Noise, Noise cancellation, Noise level, Noise reduction, Optoelectronic devices, Photodiodes, Random noise, Semiconductor device noise, Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices, Sensors