Details

Autor(en) / Beteiligte

• Dworak, J.
• Grimaila, M.R.
• Cobb, B.
• Wang, T.-C.
• Wang, L.-C.
• Mercer, M.R.

Titel

On the superiority of DO-RE-ME/MPG-D over stuck-at-based defective part level prediction

Ist Teil von

• Proceedings - Asian Test Symposium, 2000, p.151-157

Ort / Verlag

IEEE

Erscheinungsjahr

2000

Quelle

IEL

Beschreibungen/Notizen

• Uses data collected from benchmark circuit simulations to examine the relationship between the tests which detect stuck-at faults and those which detect bridging surrogates. We show that the coefficient of correlation between these tests approaches zero as the stuck-at fault coverage approaches 100%. An enhanced version of the MPG-D model, which is based upon the number of detections of each site in a logic circuit, is shown to be superior to stuck-at fault coverage-based defective part level prediction. We then compare the accuracy of both predictors for an industrial circuit tested using two different test pattern sequences.