Journal of materials science letters, 1997, Vol.16 (2), p.174-178
1997
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Details
- Autor(en) / Beteiligte
- Titel
- Thickness dependence of refractive index for anodic aluminium oxide films
- Ist Teil von
- Journal of materials science letters, 1997, Vol.16 (2), p.174-178
- Ort / Verlag
- Dordrecht: Kluwer Academic Publishers
- Erscheinungsjahr
- 1997
- Quelle
- SpringerLINK Contemporary (Konsortium Baden-Württemberg)
- Beschreibungen/Notizen
- The thickness of anodic Al sub(2)O sub(3) films was measured precisely by cross-sectional transmission electron microscopy (TEM) techniques. The measured thickness was used to fit the ellipsometry data for the unique solution of refractive index as a function of film thickness.
- Sprache
- Englisch
- Identifikatoren
- ISSN: 0261-8028DOI: 10.1023/A:1018518832762Titel-ID: cdi_proquest_miscellaneous_27387750
- Format
- –
- Schlagworte
- Condensed matter: electronic structure, electrical, magnetic, and optical properties, Exact sciences and technology, Insulators, Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation, Optical properties of specific thin films, Physics