Details

Autor(en) / Beteiligte

• Van Der Meeren, Paul
• Vanderdeelen, Jan
• Baert, Leon

Titel

Relevance of Reflection in Static and Dynamic Light Scattering Experiments

Ist Teil von

• Particle & particle systems characterization, 1994-08, Vol.11 (4), p.320-326

Ort / Verlag

Weinheim: WILEY-VCH Verlag GmbH

Erscheinungsjahr

1994

Quelle

Wiley Online Library - AutoHoldings Journals

Beschreibungen/Notizen

• Using a monodisperse PMMA dispersion, it was shown that light reflection at the sample cuvette walls may greatly influence the results of both static (SLS) and dynamic (DLS) light scattering experiments. Considering SLS, this reflection phenomenon mostly causes an overestimation of the scattered intensity at high scattering angles, which may give rise to the emergence of an additional, artificial peak in the lower region of the particle size distribution. On the other hand, the influcence of reflection on DLS measurements was shown to be particularly important in the upper region of the particle size distribution. The experimentally observed phenomena were explained from the basic principles of both particle sizing methods. Finally, it was shown that the disturbing effect of reflection could be avoided by modifying either the hardware or the software of the static and dynamic light scattering technique.