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Surface and interface analysis, 1981-02, Vol.3 (1), p.34-54
1981

Details

Autor(en) / Beteiligte
Titel
Semiconductor crystal growth by sputter deposition
Ist Teil von
  • Surface and interface analysis, 1981-02, Vol.3 (1), p.34-54
Ort / Verlag
London: Heyden & Son Ltd
Erscheinungsjahr
1981
Link zum Volltext
Quelle
Wiley Online Library Journals Frontfile Complete
Beschreibungen/Notizen
  • Recently, understanding of the physics of ion–surface interactions has progressed sufficiently to allow sputter deposition to be used as a crystal growth technique for depositing a wide variety of single crystal elemental, compound, alloy, and superlattice semiconductors. In many cases, films with essentially bulk values of carrier concentrations and mobilities have been obtained. The controlled use of low energy particle bombardment of the growing film during sputter deposition has been shown to affect all stages of crystal growth ranging from adatom mobilities and nucleation kinetics to elemental incorporation probabilities. Such effects provide inherent advantages for sputter deposition over other vapor phase techniques for the low temperature growth of compound and alloy semiconductors and are essential in allowing the growth of new and unique single crystal metastable semiconductors. This review includes sections on the physics of sputtering, experimental techniques, and ion bombardment effects on film growth as well as a discussion of recent results in the growth of elemental, III–V, II–VI, IV–VI, metastable, and other compound semiconductors.
Sprache
Englisch
Identifikatoren
ISSN: 0142-2421
eISSN: 1096-9918
DOI: 10.1002/sia.740030111
Titel-ID: cdi_proquest_miscellaneous_23843892
Format

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