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IEEE journal of solid-state circuits, 1979-06, Vol.SC-14, p.578-584
1979

Details

Autor(en) / Beteiligte
Titel
Schottky-base I2L - A high-performance LSI technology
Ist Teil von
  • IEEE journal of solid-state circuits, 1979-06, Vol.SC-14, p.578-584
Erscheinungsjahr
1979
Link zum Volltext
Quelle
IEEE/IET Electronic Library
Beschreibungen/Notizen
  • A new technology is described which offers significant advantages in packing density, device performance, and reduced LSI circuit complexity as compared to the conventional I2L. The basic logic gate in this design is a multiinput, multioutput NAND gate which consists of a p-n-p switch and an n-p-n injector. Schottky diodes are formed on the p-n-p base which is merged with the n-p-n (injector) collector. This I2L technology also offers convenient interfacing with other standard IC parts. (Totem pole and 3-state logic levels can be made available on chip.) Experimental data on a test chip indicate a p-n-p current gain of about 50, TTL-type n-p-n current gain of about 80, a delay-power product of 0.5 pJ, and a minimum delay of 10 ns for devices using 7.5-micron minimum linewidths. Based on theoretical calculations, a minimum delay time of 1.5 ns at a power dissipation of 50 to 75 microwatts/gate is projected for oxide-isolated scaled-down Schottky-base I2L gates with 1 to 1.5 micron minimum linewidths.
Sprache
Englisch
Identifikatoren
ISSN: 0018-9200
eISSN: 1558-173X
DOI: 10.1109/JSSC.1979.1051219
Titel-ID: cdi_proquest_miscellaneous_23576104
Format

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