Details

Autor(en) / Beteiligte

• Mom, Rik V.
• Onderwaater, Willem G.
• Rost, Marcel J.
• Jankowski, Maciej
• Wenzel, Sabine
• Jacobse, Leon
• Alkemade, Paul F.A.
• Vandalon, Vincent
• van Spronsen, Matthijs A.
• van Weeren, Matthijs
• Crama, Bert
• van der Tuijn, Peter
• Felici, Roberto
• Kessels, Wilhelmus M.M.
• Carlà, Francesco
• Frenken, Joost W.M.
• Groot, Irene M.N.

Titel

Simultaneous scanning tunneling microscopy and synchrotron X-ray measurements in a gas environment

Ist Teil von

• Ultramicroscopy, 2017-11, Vol.182, p.233-242

Ort / Verlag

Netherlands: Elsevier B.V

Erscheinungsjahr

2017

Quelle

Alma/SFX Local Collection

Beschreibungen/Notizen

• •First-time measurement of the local X-ray-induced current on Au(1 1 1) at a gas pressure of 800 mbar.•A coaxially shielded STM tip and mounting scheme that effectively removes the ion current background.•An electronics scheme to separate X-ray-induced current from tunneling current that enables fast height feedback.•A quick method for aligning tip and X-ray beam with micrometer precision. A combined X-ray and scanning tunneling microscopy (STM) instrument is presented that enables the local detection of X-ray absorption on surfaces in a gas environment. To suppress the collection of ion currents generated in the gas phase, coaxially shielded STM tips were used. The conductive outer shield of the coaxial tips can be biased to deflect ions away from the tip core. When tunneling, the X-ray-induced current is separated from the regular, ‘topographic’ tunneling current using a novel high-speed separation scheme. We demonstrate the capabilities of the instrument by measuring the local X-ray-induced current on Au(1 1 1) in 800 mbar Ar.