Details

Autor(en) / Beteiligte

• Coignus, Jean
• Vernhet, Alexandre
• Reimbold, Gilles
• Torrente, Giulio
• Renard, Sophie
• Roy, David

Titel

Relaxation-free characterization of Flash programming dynamics along P-E cycling

Ist Teil von

• 2015 IEEE International Integrated Reliability Workshop (IIRW), 2015, p.119-121

Ort / Verlag

IEEE

Erscheinungsjahr

2015

Quelle

IEEE Xplore

Beschreibungen/Notizen

• A novel Flash endurance characterization approach is presented, allowing delay-free READ operations and thus a realistic electrostatic description at each cycle before any device relaxation. Systematic measurement of time-dependent drain current during Hot Carrier programming is shown to provide an extended description of Flash programming dynamics with a 5ns time resolution, including tunnel oxide transport.