Details

Autor(en) / Beteiligte

• Pajek, M.
• Banaś, D.
• Braziewicz, J.
• Majewska, U.
• Semaniak, J.
• Fijał-Kirejczyk, I.
• Jaskóła, M.
• Czarnacki, W.
• Korman, A.
• Kretschmer, W.
• Mukoyama, T.
• Trautmann, D.

Titel

L X-ray emission induced by heavy ions

Ist Teil von

• Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2015-11, Vol.363, p.19-23

Ort / Verlag

Elsevier B.V

Erscheinungsjahr

2015

Quelle

Alma/SFX Local Collection

Beschreibungen/Notizen

• Particle-induced X-ray emission (PIXE) technique is usually applied using typically 1MeV to 3MeV protons or helium ions, for which the ion-atom interaction is dominated by the single ionization process. For heavier ions the multiple ionization plays an increasingly important role and this process can influence substantially both the X-ray spectra and atomic decay rates. Additionally, the subshell coupling effects are important for the L- and M-shells ionized by heavy ions. Here we discuss the main features of the X-ray emission induced by heavy ions which are important for PIXE applications, namely, the effects of X-ray line shifts and broadening, vacancy rearrangement and change of the fluorescence and Coster–Kronig yields in multiple ionized atoms. These effects are illustrated here by the results of the measurements of L X-ray emission from heavy atoms bombarded by 6MeV to 36MeV Si ions, which were reported earlier. The strong L-subshell coupling effects are observed, in particular L2-subshell, which can be accounted for within the coupling subshell model (CSM) developed within the semiclassical approximation. Finally, the prospects to use heavy ions in PIXE analysis are discussed.