Details

Autor(en) / Beteiligte

• Edelman, I. S.
• Petrakovskaja, E. A.
• Petrov, D. A.
• Zharkov, S. M.
• Khaibullin, R. I.
• Nuzhdin, V. I.
• Stepanov, A. L.

Titel

FMR and TEM Studies of Co and Ni Nanoparticles Implanted in the SiO2 Matrix

Ist Teil von

• Applied magnetic resonance, 2011-05, Vol.40 (3), p.363-375

Ort / Verlag

Vienna: Springer Vienna

Erscheinungsjahr

2011

Quelle

Alma/SFX Local Collection

Beschreibungen/Notizen

• Fused silica plates have been implanted with 40 keV Co + or Ni + ions to high doses in the range of (0.25–1.0) × 10 17 ions/cm 2 , and magnetic properties of the implanted samples have been studied with ferromagnetic resonance (FMR) technique supplemented by transmission electron microscopy, electron diffraction and energy dispersive X-ray spectroscopy. The high-dose implantation with 3 d -ions results in the formation of cobalt and nickel metal nanoparticles in the irradiated subsurface layer of the SiO 2 matrix. Co and Ni nanocrystals with hexagonal close packing and face-centered cubic structures have a spherical shape and the sizes of 4–5 nm (for cobalt) and 6–14 nm (for nickel) in diameter. Room-temperature FMR signals from ensembles of Co and Ni nanoparticles implanted in the SiO 2 matrix exhibit an out-of-plane uniaxial magnetic anisotropy that is typical for thin magnetic films. The dose and temperature dependences of FMR spectra have been analyzed using the Kittel formalism, and the effective magnetization and g -factor values have been obtained for Co- and Ni-implanted samples. Nonsymmetric FMR line shapes have been fitted by a sum of two symmetrical curves. The dependences of the magnetic parameters of each curve on the implantation dose and temperature are presented.