Details

Autor(en) / Beteiligte

• Kim, Joung-Yeal
• Jun, Young-Hyun
• Kong, Bai-Sun

Titel

CMOS Charge Pump With Transfer Blocking Technique for No Reversion Loss and Relaxed Clock Timing Restriction

Ist Teil von

• IEEE transactions on circuits and systems. II, Express briefs, 2009-01, Vol.56 (1), p.11-15

Ort / Verlag

New York: IEEE

Erscheinungsjahr

2009

Quelle

IEEE Electronic Library Online

Beschreibungen/Notizen

• A CMOS charge pump based on a transfer blocking technique and a modified precharge scheme is proposed for avoiding reversion loss and relaxing the timing restrictions imposed on input clocks. Comparison results in an 80-nm CMOS process indicate that, with no loading current, the output voltage of the proposed charge pump reaches almost 98% of the ideal boosting level with switching ripple reduced by up to 97%. They also indicate that output voltage deviations due to temperature and process variations are reduced by 24%-98% and 81%-95%, respectively.