Details

Autor(en) / Beteiligte

• Cross, Robert
• Cola, Baratunde A
• Fisher, Timothy
• Xu, Xianfan
• Gall, Ken
• Graham, Samuel

Titel

A metallization and bonding approach for high performance carbon nanotube thermal interface materials

Ist Teil von

• Nanotechnology, 2010-11, Vol.21 (44), p.445705-445705

Ort / Verlag

England: IOP Publishing

Erscheinungsjahr

2010

Quelle

Alma/SFX Local Collection

Beschreibungen/Notizen

• A method has been developed to create vertically aligned carbon nanotube (VACNT) thermal interface materials that can be attached to a variety of metallized surfaces. VACNT films were grown on Si substrates using standard CVD processing followed by metallization using Ti/Au. The coated CNTs were then bonded to metallized substrates at 220 °C. By reducing the adhesion of the VACNTs to the growth substrate during synthesis, the CNTs can be completely transferred from the Si growth substrate and used as a die attachment material for electronic components. Thermal resistance measurements using a photoacoustic technique showed thermal resistances as low as 1.7 mm(2) K W(-1) for bonded VACNT films 25-30 µm in length and 10 mm(2) K W(-1) for CNTs up to 130 µm in length. Tensile testing demonstrated a die attachment strength of 40 N cm(-2) at room temperature. Overall, these metallized and bonded VACNT films demonstrate properties which are promising for next-generation thermal interface material applications.