Details

Autor(en) / Beteiligte

• Zhang, Yingyao
• Liu, Zhiyuan
• Cheng, Shaoyong
• Yang, Lanjun
• Geng, Yingsan
• Wang, Jimei

Titel

Influence of contact contour on breakdown behavior in vacuum under uniform field

Ist Teil von

• IEEE transactions on dielectrics and electrical insulation, 2009-12, Vol.16 (6), p.1717-1723

Ort / Verlag

New York: IEEE

Erscheinungsjahr

2009

Quelle

IEEE Xplore

Beschreibungen/Notizen

• We experimentally investigated the influence of contact contour on breakdown characteristics in vacuum under uniform field. Four vacuum interrupters were used and their contact contours were designed to obtain an effective area (S eff ) from 211 mm 2 to 550 mm 2 . The contact parameters were contact diameter 42.8 mm, contact gap 6 mm, contact thickness 16 mm and contact material CuCr50. Basic impulse level (BIL) voltage (1.2 × 50 ¿s) was applied. Experimental results revealed that the effective area S eff had a significant influence on the conditioning process. The larger the effective area was, the slower the conditioning process was. When the breakdown voltage saturated, the breakdown probability distribution followed a Weibull distribution. The shape parameter that represented the breakdown voltage scatter was constant, independent of the effective area. The effective area (Seff) had no significant influence on the breakdown voltage under a uniform field in vacuum.