Details

Autor(en) / Beteiligte

• Kang, T.Y.
• Xiu, Y.Y.
• Hui, L.
• Wang, J.J.
• Tong, W.P.
• Liu, C.Z.

Titel

Effect of Bismuth on Intermetallic Compound Growth in Lead Free Solder/Cu Microelectronic Interconnect

Ist Teil von

• Journal of materials science & technology, 2011-08, Vol.27 (8), p.741-745

Ort / Verlag

Elsevier Ltd

Erscheinungsjahr

2011

Quelle

Alma/SFX Local Collection

Beschreibungen/Notizen

• The intermetallic compound （IMC） growth kinetics in pure Sn/Cu and Sn10 wt%Bi/Cu solder joints was studied, respectively, after they were aged at 160-210℃ for different time. It was found that the total IMC in Sn10 wt%Bi/Cu joint developed faster than it did in pure Sn/Cu solder joint, when they were aged at the same temperature. And the activation energy Qa for total IMC in Sn10 wt%Bi/Cu joint was lower than that for pure Sn/Cu interconnect. The IMC growth process was discussed. The IMC Cu6Sn5 was enhanced in compensation of reduced IMC Cu3Sn growth. The work reveals that Bi element containing in lead free solder alloys with 10 wt% can enhance IMC growth in lead free solder/Cu joint during service.