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On the benefit of the negative-spherical-aberration imaging technique for quantitative HRTEM
Ist Teil von
Ultramicroscopy, 2010-04, Vol.110 (5), p.500-505
Ort / Verlag
Elsevier B.V
Erscheinungsjahr
2010
Quelle
Alma/SFX Local Collection
Beschreibungen/Notizen
Employing an aberration corrector in a high-resolution transmission electron microscope, the spherical aberration
C
S can be tuned to negative values, resulting in a novel imaging technique, which is called the negative
C
S imaging (NCSI) technique. The image contrast obtained with the NCSI technique is compared quantitatively with the image contrast formed with the traditional positive
C
S imaging (PCSI) technique. For the case of thin objects negative
C
S images are superior to positive
C
S images concerning the magnitude of the obtained contrast, which is due to constructive rather than destructive superposition of fundamental contrast contributions. As a consequence, the image signal obtained with a negative spherical aberration is significantly more robust against noise caused by amorphous surface layers, resulting in a measurement precision of atomic positions which is by a factor of 2–3 better at an identical noise level. The quantitative comparison of the two alternative
C
S-corrected imaging modes shows that the NCSI mode yields significantly more precise results in quantitative high-resolution transmission electron microscopy of thin objects than the traditional PCSI mode.