Details

Autor(en) / Beteiligte

• WALTHER, T.

Titel

Electron microscopy of quantum dots

Ist Teil von

• Journal of microscopy (Oxford), 2015-03, Vol.257 (3), p.171-178

Ort / Verlag

England: Wiley Subscription Services, Inc

Erscheinungsjahr

2015

Quelle

Wiley-Blackwell Journals

Beschreibungen/Notizen

• Summary This brief review describes the different types of semiconductor quantum dot systems, their main applications and which types of microscopy methods are used to characterize them. Emphasis is put on the need for a comprehensive investigation of their size distribution, microstructure, chemical composition, strain state and electronic properties, all of which influence the optical properties and can be measured by different types of imaging, diffraction and spectroscopy methods in an electron microscope.