Details

Autor(en) / Beteiligte

• Gallo, Erik
• Glatzel, Pieter

Titel

Valence to Core X-ray Emission Spectroscopy

Ist Teil von

• Advanced materials (Weinheim), 2014-12, Vol.26 (46), p.7730-7746

Ort / Verlag

Germany: Blackwell Publishing Ltd

Erscheinungsjahr

2014

Quelle

Wiley Online Library Journals Frontfile Complete

Beschreibungen/Notizen

• This Progress Report discusses the chemical sensitivity of Kβ valence to core X‐ray emission spectroscopy (vtc‐XES) and its applications for investigating 3d‐transition‐metal based materials. Vtc‐XES can be used for ligand identification and for the characterization of the valence electronic levels. The technique provides information that is similar to valence band photoemission spectroscopy but the sample environment can be chosen freely and thus allows measurements in presence of gases and liquids and it can be applied for measurements under in situ/operando or extreme conditions. The theoretical basis of the technique is presented using a one‐electron approach and the vtc‐XES spectral features are interpreted using ground state density functional theory calculations. Some recent results obtained by vtc‐XES in various scientific fields are discussed to demonstrate the potential and future applications of this technique. Resonant X‐ray emission spectroscopy is briefly introduced with some applications for the study of 3d and 5d‐transition‐metal based systems. The chemical bond is usually described in terms of molecular orbitals, which are not physically observable. For transition‐metal‐based systems, Kβ valence to core X‐ray emission spectroscopy combined with ground state density‐functional‐theory calculations provide the bridge between the real chemical world and the tools we use to describe it. The technique is bulk‐sensitive, element‐selective, and probes the occupied electronic levels of the material under investigation.