Details

Autor(en) / Beteiligte

• Minkevicius, L
• Suzanoviciene, R
• Balakauskas, S
• Molis, G
• Krotkus, A
• Valusis, G
• Tamosiunas, V

Titel

Detection of tab wire soldering defects on silicon solar cells using terahertz time-domain spectroscopy

Ist Teil von

• Electronics letters, 2012-07, Vol.48 (15), p.1-1

Ort / Verlag

Stevenage: John Wiley & Sons, Inc

Erscheinungsjahr

2012

Beschreibungen/Notizen

• Terahertz (THz) time-domain spectroscopy was applied to measure the reflectivity spectra of a silicon solar cell with tab wire soldering defects. This study demonstrated that THz phase imaging data allows a reliable estimation of height differences of bulging tab wires within 22% as tested for 0.63 mm and 1.07 mm loop peaks. Such measurements can be implemented for automated defect correction in future solar module production lines.