Details

Autor(en) / Beteiligte

• Janssens, Koen
• Alfeld, Matthias
• Van der Snickt, Geert
• De Nolf, Wout
• Vanmeert, Frederik
• Radepont, Marie
• Monico, Letizia
• Dik, Joris
• Cotte, Marine
• Falkenberg, Gerald
• Miliani, Costanza
• Brunetti, Brunetto G

Titel

The Use of Synchrotron Radiation for the Characterization of Artists' Pigments and Paintings

Ist Teil von

• Annual review of analytical chemistry (Palo Alto, Calif.), 2013-06, Vol.6 (1), p.399-425

Ort / Verlag

United States: Annual Reviews

Erscheinungsjahr

2013

Quelle

Alma/SFX Local Collection

Beschreibungen/Notizen

• We review methods and recent studies in which macroscopic to (sub)microscopic X-ray beams were used for nondestructive analysis and characterization of pigments, paint microsamples, and or entire paintings. We discuss the use of portable laboratory- and synchrotron-based instrumentation and describe several variants of X-ray fluorescence (XRF) analysis used for elemental analysis and imaging and combined with X-ray diffraction (XRD) and X-ray absorption spectroscopy (XAS). Macroscopic and microscopic (μ-)XRF variants of this method are suitable for visualizing the elemental distribution of key elements in paint multilayers. Technical innovations such as multielement, large-area XRF detectors have enabled such developments. The use of methods limited to elemental analysis or imaging usually is not sufficient to elucidate the chemical transformations that take place during natural pigment alteration processes. However, synchrotron-based combinations of μ-XRF, μ-XAS, and μ-XRD are suitable for such studies.