Details

Autor(en) / Beteiligte

• Mossawir, B.
• Linscott, I.R.
• Inan, U.S.
• Roeder, J.L.
• Osborn, J.V.
• Witczak, S.C.
• King, E.E.
• LaLumondiere, S.D.

Titel

A TID and SEE Radiation-Hardened, Wideband, Low-Noise Amplifier

Ist Teil von

• IEEE transactions on nuclear science, 2006-12, Vol.53 (6), p.3439-3448

Ort / Verlag

New York: IEEE

Erscheinungsjahr

2006

Quelle

IEEE Electronic Library (IEL)

Beschreibungen/Notizen

• We have developed a radiation-hardened, highly linear, wideband, low-noise amplifier (LNA) with programmable gain to serve as the front-end of a plasma-wave instrument for satellite-based electric-field measurements of very low frequency (VLF) phenomena in the Van Allen radiation belts. Fabricated in a commercial 0.25-mum silicon-germanium BiCMOS process, this ASIC leverages radiation-hardness-by-design techniques at the topological, implementation, and layout levels to maintain 75-dB spurious-free dynamic range (SFDR) over nearly four decades of frequency, from 100 Hz to 1 MHz, for both proton and gamma-ray total ionizing dose (TID) exposures up to 1000 krad(Si). Single-event effect (SEE) testing via pulsed laser confirms negligible latchup sensitivity and suppression of single-event transients (SETs) at the output for beam energy LET equivalents in excess of 100MeV-cm 2 /mg in even the most sensitive regions of the die