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Autor(en) / Beteiligte
Titel
Use of microwave induced plasma spectrometry as detector for the determination of O, N and H traces after carrier gas hot extraction
Ist Teil von
  • Journal of analytical atomic spectrometry, 2008, Vol.23 (4), p.588-591
Erscheinungsjahr
2008
Quelle
Alma/SFX Local Collection
Beschreibungen/Notizen
  • The determination of O, N and H using a microwave induced plasma coupled to carrier gas hot extraction was exploratory investigated. The signal intensities versus time of blanks and calibration materials were recorded. To check for interferences the signal intensities versus wavelength were recorded at the times just before increase and at the maximum of the time dependent analytical signal. O, N and H were investigated at their prominent wavelengths of 777 nm, 174 nm and 486 nm, respectively. Calibration was performed for O, N and H in the ranges of 0-27 [small mu]g, 35-1000 [small mu]g and 3-43 [small mu]g respectively. For concentration values in the middle of the linear part of the investigated calibration interval, a relative precision of 5% at 13 [small mu]g, 2% at 74 [small mu]g and 0.6% at 23 [small mu]g for O, N and H respectively was found. The maximum matrix load to the plasma used was found to be 150 [small mu]g min-1. From the signal to noise ratio and the sensitivity obtained, instrumental limits of detection (3s) of 0.01 [small mu]g for O, 1 [small mu]g for N and 0.1 [small mu]g for H were found. Assuming a typical sample mass of 1 g this corresponds to relative LODs of 0.01 [small mu]g g-1, 1 [small mu]g g-1 and 0.1 [small mu]g g-1 for O, N and H respectively. TY - JOUR
Sprache
Englisch
Identifikatoren
ISSN: 0267-9477
eISSN: 1364-5544
DOI: 10.1039/b714734a
Titel-ID: cdi_proquest_miscellaneous_1221860471

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