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Fatigue-Free, Electrically Reliable Copper Electrode with Nanohole Array
Ist Teil von
Small (Weinheim an der Bergstrasse, Germany), 2012-11, Vol.8 (21), p.3300-3306
Ort / Verlag
Weinheim: WILEY-VCH Verlag
Erscheinungsjahr
2012
Link zum Volltext
Quelle
Wiley Online Library Journals Frontfile Complete
Beschreibungen/Notizen
Design and fabrication of reliable electrodes is one of the most important challenges in flexible devices, which undergo repeated deformation. In conventional approaches, mechanical and electrical properties of continuous metal films degrade gradually because of the fatigue damage. The designed incorporation of nanoholes into Cu electrodes can enhance the reliability. In this study, the electrode shows extremely low electrical resistance change during bending fatigue because the nanoholes suppress crack initiation by preventing protrusion formation and damage propagation by crack tip blunting. This concept provides a key guideline for developing fatigue‐free flexible electrodes.
Nanohole‐structured fatigue‐damage‐free metal electrode is developed using a nanorod polymer substrate to realize highly stable flexible devices. The nanohole metal electrode shows almost no degradation of the electrical resistance during repeating bending deformation because of the suppression of damage initiation and propagation.