UNIVERSI
TÄ
TS-
BIBLIOTHEK
P
ADERBORN
Anmelden
Menü
Menü
Start
Hilfe
Blog
Weitere Dienste
Neuerwerbungslisten
Fachsystematik Bücher
Erwerbungsvorschlag
Bestellung aus dem Magazin
Fernleihe
Einstellungen
Sprache
Deutsch
Deutsch
Englisch
Farbschema
Hell
Dunkel
Automatisch
Sie befinden Sich nicht im Netzwerk der Universität Paderborn. Der Zugriff auf elektronische Ressourcen ist
gegebenenfalls
nur via VPN oder Shibboleth (DFN-AAI) möglich.
mehr Informationen...
Universitätsbibliothek
Katalog
Suche
Details
Zur Ergebnisliste
Ergebnis 16 von 59
Datensatz exportieren als...
BibTeX
Capability assessment for processes with multiple characteristics: A generalization of the popular index Cpk
Quality and reliability engineering international, 2011-12, Vol.27 (8), p.1119-1129
Pearn, W. L.
Shiau, J.-J. H.
Tai, Y. T.
Li, M. Y.
2011
Details
Autor(en) / Beteiligte
Pearn, W. L.
Shiau, J.-J. H.
Tai, Y. T.
Li, M. Y.
Titel
Capability assessment for processes with multiple characteristics: A generalization of the popular index Cpk
Ist Teil von
Quality and reliability engineering international, 2011-12, Vol.27 (8), p.1119-1129
Ort / Verlag
Chichester, UK: John Wiley & Sons, Ltd
Erscheinungsjahr
2011
Link zum Volltext
Quelle
Wiley Online Library
Beschreibungen/Notizen
Process capability index Cpk is the most popular capability index widely used in the manufacturing industry. Existing research on the yield‐based measure index Cpk to date is restricted to processes with single characteristics. However, many manufacturing processes are commonly described with multiple characteristics, for example, the gold bumping process in the TFT‐LCD (thin film transistor‐liquid crystal display) manufacturing industry. In the gold bumping process, gold bumps have multiple characteristics all having effects on the process yield. Obtaining accurate gold bumping manufacturing yield is very important for quality assurance and in providing guidance toward process improvement. To obtain accurate yield assessment for processes with multiple characteristics, we propose a new overall yield‐measure index C Tpk, which is a generalization of the index Cpk, and a natural estimator of C Tpk. For the purpose of making inferences on the process capability, we derive a quite accurate approximation of the distribution of since the distribution is analytically intractable. With this distribution, we tabulate the lower confidence bounds of the new index under various sample sizes for in‐plant applications. In addition, we construct a statistical test on the new yield‐measure index in order to examine whether the yield meets the customers' requirements. For illustration purpose, a real case in a gold bumping factory located in the Science‐based Industrial Park at Hsinchu, Taiwan is presented. Copyright © 2011 John Wiley & Sons, Ltd.
Sprache
Englisch
Identifikatoren
ISSN: 0748-8017, 1099-1638
eISSN: 1099-1638
DOI: 10.1002/qre.1200
Titel-ID: cdi_proquest_miscellaneous_1031293322
Format
–
Schlagworte
Assessments
,
capability assessment
,
Confidence intervals
,
Gold
,
Industrial parks
,
lower confidence bound
,
Manufacturing engineering
,
Mathematical analysis
,
multiple characteristics
,
Samples
,
Statistical methods
,
yield
Weiterführende Literatur
Empfehlungen zum selben Thema automatisch vorgeschlagen von
bX