Details

Autor(en) / Beteiligte

• Lorenc, Dusan
• Jane, Eduard
• Stupavska, Monika
• Jerigova, Monika
• Velic, Dusan

Titel

Infrared Femtosecond Laser Preionization in Secondary Ion Mass Spectrometry of Silver Surface

Ist Teil von

• Journal of the American Society for Mass Spectrometry, 2012-07, Vol.23 (7), p.1266-1270

Ort / Verlag

New York: Springer-Verlag

Erscheinungsjahr

2012

Quelle

Alma/SFX Local Collection

Beschreibungen/Notizen

• An alternative secondary ion mass spectrometry utilizing laser preionization is introduced. The native Ag sample surface is first irradiated with laser pulse (100 fs duration, 10 10 –10 11  W/cm 2 intensity, 1240 nm wavelength) and subsequently bombarded with primary ions (Bi 3 + , 10 ns duration, 25 keV energy). Multiple correlation patterns are observed in the mass spectra, confirming the mutual laser-secondary ion mass spectrometry (SIMS) interplay in the preionization mechanism. The Ag + , C 3 H 5 + , C 3 H 5 O 3 + , and AgOH + , C 4 H 5 O 4 + are observed with the shallow and steep increasing of intensities at 1.3 × 10 11  W/cm 2 and 1.5 × 10 11  W/cm 2 , respectively. Two ionization mechanisms are identified, the ion sputtering regime for intensities of less than 1.4 × 10 11  W/cm 2 and the multiphoton ionization at higher intensities. The Ag saturation intensity obtained from fitting is 2.4 × 10 13  W/cm 2 , close to the one reported for postionization. The proposed preionization approach might eliminate the need for high peak power/high intensity laser source and, moreover, the experiment geometry ensures that large areas of the sample are affected by the laser beam.