Sie befinden Sich nicht im Netzwerk der Universität Paderborn. Der Zugriff auf elektronische Ressourcen ist gegebenenfalls nur via VPN oder Shibboleth (DFN-AAI) möglich. mehr Informationen...
Ergebnis 24 von 167

Details

Autor(en) / Beteiligte
Titel
Dielectric and mechanical properties of porous Si3N4–Kovar composites prepared by low‐temperature oxidation sintering
Ist Teil von
  • Journal of the American Ceramic Society, 2024-07, Vol.107 (7), p.5082-5092
Ort / Verlag
Columbus: Wiley Subscription Services, Inc
Erscheinungsjahr
2024
Link zum Volltext
Quelle
Wiley Online Library Journals Frontfile Complete
Beschreibungen/Notizen
  • The aim of this study is to investigate the impact of the Kovar glass content on the mechanical and electrical properties of Si3N4–Kovar composites sintering at air atmosphere. To achieve this, Si3N4–Kovar composites were prepared using molding technology with the Kovar glass powder ranging from 20 to 70 wt%. The phase composition, morphology, bulk density, apparent porosity, flexural strength at room temperature, dielectric constant, and dielectric loss of the composites were all examined in relation to changing the Kovar glass content. During the sintering process, the α‐quartz on the surface of Si3N4 particles acted as the crystal nucleus, inducing the crystallization of the glass at the wetting position that the Kovar glass and the surface of the Si3N4 particles. A small amount of the β‐quartz phase was crystallized at 750–850°C, followed by a large amount of the β‐quartz phase crystallizing above 900°C. Additionally, some β‐quartz phase transformed into the metastable β‐cristobalite phase that could exist below 1470°C. During the cooling process, the β‐cristobalite phase transformed into a low‐temperature α‐cristobalite phase, while the β‐quartz phase transformed into a low‐temperature α‐quartz phase. The results indicate that the Si3N4–Kovar glass composite with 60 wt% the Kovar glass content sintered at 900°C exhibits higher density (1.88 g/cm3), lower porosity (25.4%), higher flexural strength (55.34 MPa), lower dielectric constant (3.46), and lower dielectric loss (4.26 × 10−3).

Weiterführende Literatur

Empfehlungen zum selben Thema automatisch vorgeschlagen von bX