Details

Autor(en) / Beteiligte

• Tomita, Takuro
• Bando, Yota
• Takenaka, Kazumasa
• Tanaka, Yasuhiro
• Yamaguchi, Makoto
• Nakashima, Shin-ichi
• Okada, Tatsuya

Titel

Surface-polarity-dependent Raman spectra of ultrathin silicon carbide crystal

Ist Teil von

• Applied physics. A, Materials science & processing, 2023-06, Vol.129 (6), Article 420

Ort / Verlag

Berlin/Heidelberg: Springer Berlin Heidelberg

Erscheinungsjahr

2023

Quelle

Alma/SFX Local Collection

Beschreibungen/Notizen

• The surface-polarity-dependent Raman spectra of ultrathin silicon carbide crystal are reported. The relative Raman intensity of the folded-transverse-acoustic phonon to the folded-transverse-optical phonon modes differs drastically between silicon-terminated face (Si-face) and carbon-terminated face (C-face) only for sample thickness below 150 nm. For samples thicker than 150 nm, the relative Raman intensity ratio takes an almost constant value for both Si- and C-faces. These results indicate that the phonon modes confined in the near-surface region are the possible origin of the observed surface-polarity-dependent Raman spectra.