Sie befinden Sich nicht im Netzwerk der Universität Paderborn. Der Zugriff auf elektronische Ressourcen ist gegebenenfalls nur via VPN oder Shibboleth (DFN-AAI) möglich. mehr Informationen...
Ergebnis 5 von 63

Details

Autor(en) / Beteiligte
Titel
Effect of beam oscillation on microstructure, defect density, and resistivity of electron beam welded niobium
Ist Teil von
  • Welding in the world, 2022-12, Vol.66 (12), p.2483-2495
Ort / Verlag
Berlin/Heidelberg: Springer Berlin Heidelberg
Erscheinungsjahr
2022
Quelle
Alma/SFX Local Collection
Beschreibungen/Notizen
  • The degradation of residual resistivity ratio (RRR) in the weld zone of the electron beam welded component is the main problem associated with the application of a niobium-based cavity. The present study concerns understanding the effect of beam oscillation on the characteristics of electron beam welded niobium processed under optimum current, voltage, and scan speed. In the electron beam welded niobium, there is coarsening of microstructure in the weld zone. Grain size in the range of 1 mm has been in the fusion zone as compared to 20 µm in the as-received material. It is observed that there is an increased area fraction (82 to 94%) of low-angle grain boundary (< 15°) in the weld zone as compared to the base metal (75.2%). Beam oscillation does not seem to have any significant impact on the microhardness and it remains almost constant across the fusion zone (FZ), heat-affected zone (HAZ), and base metal. No new phase has formed after electron beam welding but a strong texturing effect along (110) plane has been observed in the fusion zone. Beam oscillation was also found to increase the residual stress in the fusion zone (223.3 to 358.1 MPa) as compared to the static beam. In addition, beam oscillation causes increased resistivity in the weld zone due to the introduction of a larger volume fraction of micro porosities (0.4 vol%) as compared to the static beam (0.2 vol. %).

Weiterführende Literatur

Empfehlungen zum selben Thema automatisch vorgeschlagen von bX