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IEEE transactions on instrumentation and measurement, 2022, Vol.71, p.1-14
2022
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Autor(en) / Beteiligte
Titel
A Contact On-Machine Measurement Points’ Planning Method Based on Similarity of 3-D Process Element
Ist Teil von
  • IEEE transactions on instrumentation and measurement, 2022, Vol.71, p.1-14
Ort / Verlag
New York: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Erscheinungsjahr
2022
Quelle
IEEE Xplore
Beschreibungen/Notizen
  • Aiming at the problems that the measurement point planning in the contact-type on-machine measurement (OMM) process mainly relies on the knowledge and experience of the site engineers, and the measurement points’ information of the historical model is not sufficiently reused, a contact OMM points planning method based on similarity of 3-D process element is proposed. By analyzing the requirements of the integrated machining–measurement scenario of modular product parts and using processing features as the measurement unit based on the expression of model-based definition (MBD) information, several types of process factors that affect quality measurement are analyzed and quantitatively evaluated. Then, under the similarity evaluation standard of the constructed 3-D process element including multilevel information, relying on the developed computer-aided inspection planning (CAIP) system, the final OMM points planning scheme is generated through several reuse ways of historical model measurement point information. Finally, the feasibility of this scheme is verified by the OMM experiment of the A-plate of an injection mold for making the stud terminal and the related comparative experiments.
Sprache
Englisch
Identifikatoren
ISSN: 0018-9456
eISSN: 1557-9662
DOI: 10.1109/TIM.2022.3212526
Titel-ID: cdi_proquest_journals_2728570379

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