Details

Autor(en) / Beteiligte

• Malmivirta, M
• Palonen, H
• Huhtinen, H
• Paturi, P

Titel

The dependence of resistively measured Bc2 and Birr on BaZrO3 concentration in YBa2Cu3O6+x thin films

Ist Teil von

• Journal of physics. Conference series, 2014-05, Vol.507 (1)

Ort / Verlag

Bristol: IOP Publishing

Erscheinungsjahr

2014

Quelle

EZB Electronic Journals Library

Beschreibungen/Notizen

• The effect of BaZrO3 (BZO) concentration on Birr and Bc2 in YBa2Cu3O6+x (YBCO) thin films was investigated with resistive measurements. It was found that in field out-of-plane configuration both Birr and Bc2 decrease with the highest BZO concentration of 9 wt% whereas the other samples show no significant change. The angular dependence of Birr of the highest BZO concentration sample has a pronounced c-axis peak that is typical for BZO-doped YBCO but the others do not exhibit that clear peak. On the other hand, Bc2 obeys the Blatter scaling law and the Blatter scaling parameter γ levels off to 3 − 3.5 above few wt% of BZO.