Details

Autor(en) / Beteiligte

• Llamas-Garro, I.
• Coutinho, M. S.
• de Melo, M. T.
• Oliveira, M. R. T.
• Araujo, J. A. I.
• Cavalcanti Filho, P. H. B.
• da Silva, L. M.
• Palumbo, Davide
• Davide Palumbo

Titel

Planar Sensor for Material Characterization Based on the Sierpinski Fractal Curve

Ist Teil von

• Journal of sensors, 2020-12, Vol.2020 (2020), p.1-9

Ort / Verlag

Cairo, Egypt: Hindawi Publishing Corporation

Erscheinungsjahr

2020

Quelle

Alma/SFX Local Collection

Beschreibungen/Notizen

• This paper presents a planar and compact microwave resonator sensor to characterize materials. The geometry of the resonator is based on the Sierpinski fractal curve and has four poles in the frequency range from 0.5 GHz to 5.5 GHz. Any of the four poles can be used to measure samples with low permittivity values, where the first pole is suitable for samples with high permittivity values. The sensitivity of the poles and return losses of the sensor are presented and obtained using a full-wave 3D simulator software. The device is manufactured and validated through a comparison between simulated and measured results.