Details

Autor(en) / Beteiligte

• Jaglarz, Janusz
• Dulian, Piotr
• Karasiński, Paweł

Titel

Thermo-optical properties of porous silica thin films produced by sol-gel method

Ist Teil von

• Materials chemistry and physics, 2020-03, Vol.243, p.122603, Article 122603

Ort / Verlag

Lausanne: Elsevier B.V

Erscheinungsjahr

2020

Quelle

Elsevier ScienceDirect Journals

Beschreibungen/Notizen

• In this work, the spectral dispersion of optical constants of porous silica thin films have been presented. To determine the optical properties of porous SiO2 films, the ellipsometer Woolam M − 2000 working in the spectral range 190–1700 nm was applied. The thermo-optical coefficients of porous SiO2 films and thermal thickness dependence in temperature range 25–300 °C have been determined. The porous SiO2 layers exhibited low refractive indices. The thermo-optical coefficients of presented samples were negative due to the porous structure of SiO2 films. Moreover, it has been stated that thinness has been independent of temperature. After returning to starting conditions, the refractive indices were closer to starting values which confirmed partial reversibility of the heating and cooling process of porous. The thermal properties of porous silica films have been discussed. •Thermooptical properties of SiO2 films have been described by spectroscopic ellipsometry in wavelength range (190-1700 nm).•The dynamic changes of optical parameters upon a temperature for porous silica films were determined.•The thermooptical coefficients (TOC) for porous SiO2 films were negative in temperature range of 25–300 °C.•Three separated temperature areas of constant TOC values were distinguished