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Enhanced Electrical and Optical Characteristics of Co/Phenol Red (PR)/Silicon Hybrid Heterojunction for Photodiode and Thermal Applications
Ist Teil von
Journal of electronic materials, 2020-08, Vol.49 (8), p.4952-4961
Ort / Verlag
New York: Springer US
Erscheinungsjahr
2020
Quelle
SpringerNature Journals
Beschreibungen/Notizen
A Co/phenol red (PR)/
n
-Si/Al device has been fabricated and its current–voltage (
I
–
V
) characteristics measured between 80 K and 460 K. Junction parameters of the device, such as the ideality factor, barrier height, interface state density, and series resistance (
R
s
), were determined using standard thermionic emission theory, the Cheung function, and the Norde method. The application of these approaches revealed that
n
varied between 4.66 and 1.70 in the temperature range of 80 K to 460 K, while Φ
b
varied between 0.24 eV and 0.83 eV in the same temperature range. These variations of
n
and Φ
b
can be attributed to the barrier height inhomogeneity in the device. Although PR is generally used in biological applications such as cell culture, it has been observed that such Co/phenol red/
n
-Si/Al devices may be critical candidates for use in thermal sensors and photodiode applications due to their photoresponse and low-temperature operation for reverse-bias
I
–
V
measurements. Furthermore, PR is an alternative to semiconductor materials commonly used in such applications.