Details

Autor(en) / Beteiligte

• Choi, Eunjeong
• Kim, Jeongtae

Titel

Deep Learning Based Defect Inspection Using the Intersection Over Minimum Between Search and Abnormal Regions

Ist Teil von

• International journal of precision engineering and manufacturing, 2020-04, Vol.21 (4), p.747-758

Ort / Verlag

Seoul: Korean Society for Precision Engineering

Erscheinungsjahr

2020

Quelle

Alma/SFX Local Collection

Beschreibungen/Notizen

• We present a deep learning based defect inspection system that detects bounding boxes for any identified defect regions. In contrast to existing deep learning based object detection methods, the proposed method detects defects based on the intersection over minimum between a proposal region and defect regions rather than the well-known intersection over union, since intersection over minimum is more effective to detect variously sized defects. The proposed method also provides significant improvements over existing methods such as efficient training by minimizing cross entropy loss function, and efficient defect detection using multiple proposal boxes for the defect and entire image. We verified that the proposed method provides improved performance compared with existing methods using simulation and experimental studies.