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High-performance energy storage and breakdown strength of low-temperature laser-deposited relaxor PLZT thin films on flexible Ti-foils
Ist Teil von
Journal of alloys and compounds, 2019-09, Vol.802, p.422-429
Ort / Verlag
Lausanne: Elsevier B.V
Erscheinungsjahr
2019
Quelle
Alma/SFX Local Collection
Beschreibungen/Notizen
The microstructure, ferroelectric, electric-field breakdown strength, and energy-storage properties of relaxor Pb0.9La0.1(Zr0.52Ti0.48)O3 (PLZT) thin films grown on flexible Ti foils using pulsed laser deposition were systematically investigated. Low temperature deposited PLZT thin films showed very slim polarization hysteresis loops with a high difference between maximum and remanent polarizations and low remanent polarization through modulating the film structure with a small columnar-grain size. An ultrahigh recoverable energy density (Ureco) of 40.9 J/cm3, excellent energy efficiency (η) of 80.2% and large breakdown strength (EBD) of 3000 kV/cm were achieved in a PLZT film deposited at the low temperature of 480 °C. More importantly, this film shows excellent charge-discharge cycling endurance with a small variation of both Ureco and η values (less than 3%) after 1010 cycles and good thermal stability under a wide operating temperature range from room temperature to 200 °C. These results indicate that the relaxor PLZT films deposited on thin Ti foils, even at low temperature, are a promising strategy to enhance energy-storage performance for pulse-power energy-storage systems with broad temperature range applications, especially in applications where the device weight is critical (lightweight) due to the thin and low density of Ti foils.
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•Relaxor ferroelectric PLZT films deposited on thin Ti foils.•Ultrahigh discharge density and efficiency in the film deposited at low temperature.•Large electric breakdown strength in the film with small and homogeneous grain size.•Excellent charge-discharge cycling endurance and good thermal stability.