Details

Autor(en) / Beteiligte

• Schnieders, Albert

Titel

Time-of-Flight Secondary Ion Mass Spectrometry

Ist Teil von

• Microscopy today, 2011-03, Vol.19 (2), p.30-33

Ort / Verlag

New York, USA: Cambridge University Press

Erscheinungsjahr

2011

Link zum Volltext

Quelle

Alma/SFX Local Collection

Beschreibungen/Notizen

• The properties of many modern products are not only governed by their surface morphology and structure but also by their surface chemistry. For example, in some cases a contamination of less than a monolayer of molecules can be responsible for the failure of a coating with all its consequences (aesthetics, protection, life time, and so on). Other areas affected by surface chemistry are adhesion, staining, corrosion, and so on. Thus, powerful analytical techniques for the identification, as well as the localization and quantification, of substances on a surface or at the interface between different layers are of increasing importance for fast and efficient failure analysis. However, surface analysis is not only limited to failure analysis but can be also used in research and development of, for example, methods of surface modification on the molecular level as well as in production and quality control, such as the evaluation of cleaning procedures.