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Rapid development in fabrication of solar cells requires innovations in characterization of the layers. Particular attention deserves structural imperfections which cannot be directly investigated by optical methods in a visible range. In this paper, we present two terahertz (THz) imaging approaches - Terahertz-Time Domain spectroscopy (THz-TDS)-based and continuous wave (CW) -based THz imaging - which can successfully serve as powerful experimental tool for versatile characterization of the solar cells.