IEEE transactions on power electronics, 2007-07, Vol.22 (4), p.1508-1513
2007
Volltextzugriff (PDF)
Details
- Autor(en) / Beteiligte
- Titel
- Characterization of Cdv/dt Induced Power Loss in Synchronous Buck DC-DC Converters
- Ist Teil von
- IEEE transactions on power electronics, 2007-07, Vol.22 (4), p.1508-1513
- Ort / Verlag
- New York, NY: IEEE
- Erscheinungsjahr
- 2007
- Quelle
- IEEE Electronic Library Online
- Beschreibungen/Notizen
- Good understanding of power loss in a high frequency synchronous buck converter is important for design optimization of both discrete and system level. Most of the power losses are relatively easy to quantify. The exception is the power loss associated with Cdv/dt induced turn on of the low-side metal oxide semiconductor field effect transistor (synchronous rectifier). This paper characterizes the Cdv/dt induced power loss in two ways. First, detailed device characterization, in-circuit testing, and modeling are used for a comparative loss calculation. This method offers detailed loss breakdown but requires specialized test equipment and is rather complicated and time consuming. A simple method is then introduced to accurately quantify the Cdv/dt loss. With this method, the Cdv/dt induced power loss on synchronous buck converters at different operation conditions can be readily assessed. The impacts of Cdv/dt induced loss on different applications are addressed. Finally, the design tradeoffs at both discrete and system levels are discussed.
- Sprache
- Englisch
- Identifikatoren
- ISSN: 0885-8993eISSN: 1941-0107DOI: 10.1109/TPEL.2007.900527Titel-ID: cdi_proquest_journals_206685155
- Format
- –
- Schlagworte
- Applied sciences, Breakdown, Buck converters, Capacitors, Circuit properties, Circuits, Convertors, Design optimization, Diodes, Electric power, Electric, optical and optoelectronic circuits, Electrical engineering. Electrical power engineering, Electrical machines, Electronic circuits, Electronics, Exact sciences and technology, FETs, High frequencies, Mathematical models, Metal oxide semiconductor field effect transistor (MOSFET), Methods, MOSFET circuits, Power electronics, power supplies, Power loss, Rectifiers, Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices, Signal convertors, Switching loss, Synchronous, synchronous rectifiers, Testing, Transistors, Voltage, voltage regulators (VRs)