Sie befinden Sich nicht im Netzwerk der Universität Paderborn. Der Zugriff auf elektronische Ressourcen ist gegebenenfalls nur via VPN oder Shibboleth (DFN-AAI) möglich. mehr Informationen...
Oxygen vacancy on semiconductor has been usually considered as donor contributor which can improve the charge transfer capacity of the photoanode. However, oxygen vacancy has also been found to perform as recombination center for the photogenerated charges. Herein, electrochemical reduction method is employed to treat the surface of Mo‐doped BiVO4 (BiMoVO) photoanode. Experimental data indicate that when the reduction potential is located at −0.8 V (vs Ag/AgCl), quasioxygen vacancy is formed on the (020) facet (only BiO bonds crack), the electron mobility and photo‐electrochemical (PEC) current density of the BiMoVO photoanode are increased dramatically. However, with the reduction potential increasing to −1.2 V, oxygen vacancy is formed on the surface of (020) facet (both BiO and VO bonds crack simultaneously), the PEC current density is decreased obviously. Further density functional theory calculation data point out that a moderate level of reduction is a key factor for the adjustment of photoanode performance. Thus, these results demonstrate first that oxygen vacancy actually is not the positive factor to improve the PEC performance of a BiVO4 photoelectrode, but the quasioxygen vacancy forming on the surface of the active facet is.
Oxygen vacancy on the surface of BiVO4 photoanode is a double‐edged sword for the photo‐electrochemical performance. It can increase the free charge density of BiVO4, but inducing the recombination of free photogenerated carriers. This article demonstrates that quasioxygen vacancy forming on the surface of the BiVO4 active facet is the true reason to improve the photo‐electrochemical performance of it.