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Two-photon confocal microscopy as a tool for nonequilibrium charge-carrier lifetime tomography in semiconductor materials
Ist Teil von
JETP letters, 2016-12, Vol.104 (11), p.754-758
Ort / Verlag
Moscow: Pleiades Publishing
Erscheinungsjahr
2016
Link zum Volltext
Quelle
SpringerLink (Online service)
Beschreibungen/Notizen
By the example of ZnSe crystals, the capabilities of two-photon confocal microscopy as a tool for obtaining “planar” maps of nonequilibrium charge-carrier lifetimes in semiconductor materials and for investigating other direct-gap semiconductors and semiconductor heterostructures are considered. It is shown that such maps with a depth step and an in-plane resolution of several microns can be obtained for distances from the surface up to 1 mm. This technique is used to visualize inhomogeneities in the crystals under study and to examine their structure and luminescence characteristics.