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Applied Mechanics and Materials, 2013-08, Vol.372, p.586-589
2013
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Autor(en) / Beteiligte
Titel
Minimization of Open Circuit Voltage Fluctuation of Quantum Dot Based Solar Cell Using InN
Ist Teil von
  • Applied Mechanics and Materials, 2013-08, Vol.372, p.586-589
Ort / Verlag
Zurich: Trans Tech Publications Ltd
Erscheinungsjahr
2013
Quelle
Alma/SFX Local Collection
Beschreibungen/Notizen
  • This paper reports the improvement of open circuit voltage stability of solar cell using InN based quantum dot in the active layer of the device structure. We have analyzed theoretically the temperature dependence of the open circuit voltage of the solar cell to investigate its fluctuation using Ge and InN based quantum dot in the active layer of the solar cell. Numerical results obtained are compared. The comparison results reveal that the open circuit voltage has been reduced a little bit but the fluctuation of terminal voltage has been reduced significantly by using InN quantum dot in the active layer of the device structure. Therefore InN is proved to be an excellent material to fabricate solar cell to provide higher stability in the open circuit voltage of the solar cell in very near future.
Sprache
Englisch
Identifikatoren
ISBN: 3037857978, 9783037857977
ISSN: 1660-9336, 1662-7482
eISSN: 1662-7482
DOI: 10.4028/www.scientific.net/AMM.372.586
Titel-ID: cdi_proquest_journals_1442192208
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